The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
May. 14, 2010
Applicants:
Hwa Joon Park, Seoul, KR;
Jeoung Ku Hwang, Seoul, KR;
Chan IL Chung, Seoul, KR;
Cha Hee Kim, Anyang-si, KR;
Min Sung Kim, Hwaseong-si, KR;
Inventors:
Hwa Joon Park, Seoul, KR;
Jeoung Ku Hwang, Seoul, KR;
Chan Il Chung, Seoul, KR;
Cha Hee Kim, Anyang-si, KR;
Min Sung Kim, Hwaseong-si, KR;
Assignee:
Nanoentek, Inc., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/243 (2006.01); H04N 9/47 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a fluorescent microscope and a remote control system thereof. The present invention reduces the size of the fluorescent microscope to facilitate transportation and management and be disposed in a narrow place such as the inside of the incubator or the clean bench, etc. and observes the samples through a remote control, thereby making it possible to improve the user convenience.