The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Oct. 11, 2007
Applicants:

David Nilson, Walnut Creek, CA (US);

Michael D. Cable, Danville, CA (US);

Bradley W. Rice, Danville, CA (US);

Kevin Kearney, Fairport, NY (US);

Inventors:

David Nilson, Walnut Creek, CA (US);

Michael D. Cable, Danville, CA (US);

Bradley W. Rice, Danville, CA (US);

Kevin Kearney, Fairport, NY (US);

Assignee:

Xenogen Corporation, Alameda, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention integrates a structured light source into an imaging system for reconstructing surface topography of an object being imaged. The structured light source includes a mechanism for transmitting a set of lines onto the object from an angle. The lines are displaced, or phase shifted relative to a stage, when they encounter an object with finite height, such as a mouse. This phase shift provides structured light information for the object. A camera captures the structured light information. Using software that employs a structured light analysis, surface topography data for the object is determined from the phase shift of the lines.


Find Patent Forward Citations

Loading…