The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Apr. 10, 2008
Applicants:

Sapna Shroff, Rochester, NY (US);

David R. Williams, Rochester, NY (US);

James Fienup, Rochester, NY (US);

Inventors:

Sapna Shroff, Rochester, NY (US);

David R. Williams, Rochester, NY (US);

James Fienup, Rochester, NY (US);

Assignee:

University of Rochester, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/222 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object to be imaged is illuminated with a structured (e.g., sinusoidal) illumination at a plurality of phase shifts to allow lateral superresolution and axial sectioning in images. When an object is to be imaged in vitro or in another situation in which the phase shifts cannot be accurately determined a priori, the images are taken, and the phase shifts are estimated a posteriori from peaks in the Fourier transforms. The technique is extended to the imaging of fluorescent and non-fluorescent objects as well as stationary and non-stationary objects.


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