The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Aug. 25, 2009
Thomas Murphy, Boulder Creek, CA (US);
Kevin Rathburn, Campbell, CA (US);
Keen Hun Leong, Penang, MY;
Sarangan Narasimhan, San Jose, CA (US);
Thomas Murphy, Boulder Creek, CA (US);
Kevin Rathburn, Campbell, CA (US);
Keen Hun Leong, Penang, MY;
Sarangan Narasimhan, San Jose, CA (US);
PixArt Imaging Inc., Science-Based Industrial Park, Hsin-Chu, TW;
Abstract
Several different methods of testing the integrity and proper operation of the drive and sense electrodes in a mutual capacitance sensing device such as a touchscreen or touchpad are disclosed herein. According to one embodiment, measured values of mutual capacitance corresponding to individual cells in a mutual capacitance sensing device are compared to one another and to predetermined thresholds. The results of the comparison are employed to determine whether any of the traces forming the electrodes in the device are defective. By way of example, traces can be defective if they are broken, too thin, too thick, or shorted together. The various embodiments of the methods disclosed herein may be used for touchscreen or touchpad quality control in a manufacturing setting, or may be used to test touchscreens or touchpads that have already been incorporated into electronic devices. The various methods disclosed herein lower manufacturing costs, increase product quality and yield, and may be carried out quickly.