The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Feb. 18, 2009
Applicants:

Choon Meng Chua, Singapore, SG;

Lian Ser Koh, Singapore, SG;

Soon Huat Tan, Singapore, SG;

Wah Pheng Chua, Singapore, SG;

Chee Hong Jacob Phang, Singapore, SG;

Inventors:

Choon Meng Chua, Singapore, SG;

Lian Ser Koh, Singapore, SG;

Soon Huat Tan, Singapore, SG;

Wah Pheng Chua, Singapore, SG;

Chee Hong Jacob Phang, Singapore, SG;

Assignee:

Semicaps Pte Ltd, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for measuring laser induced phenomena changes of at least one of a resistance, a capacitance and an inductance in a semiconductor device. The method comprises applying a biasing voltage from an emitter-follower circuit to a device under test (DUT); inducing said changes in the DUT; and measuring a voltage change in a collector portion of the emitter-follower circuit as a measure for said changes.


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