The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Sep. 16, 2009
Applicants:

Naoki Murakami, Ashigarakami-gun, JP;

Hisashi Ohtsuka, Ashigarakami-gun, JP;

Morihito Ikeda, Ashigarakami-gun, JP;

Inventors:

Naoki Murakami, Ashigarakami-gun, JP;

Hisashi Ohtsuka, Ashigarakami-gun, JP;

Morihito Ikeda, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 27/24 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a device for mass spectrometry, an analyte contained in a sample is desorbed from a surface of the device by irradiating the sample in contact with the surface with measurement light. The device includes a micro-structure having a plurality of metal bodies on a surface of a substrate, and the plurality of metal bodies have sizes that can excite localized plasmons by irradiation with the measurement light. Further, the device includes an initiator fixed at least to a part of a surface of the micro-structure.


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