The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8276539 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 02, 2012

Filed:

Feb. 04, 2009
Applicant:

Tomonori Kawakami, Hamamatsu, JP;

Inventor:

Tomonori Kawakami, Hamamatsu, JP;

Assignee:

Hamamatsu-Photonics K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05B 5/025 (2006.01); B05C 11/00 (2006.01); C12N 15/88 (2006.01);
U.S. Cl.
CPC ...
Abstract

An observation sample is prepared by immobilizing a nanomaterial on a substrateby applying a voltage between a nanomaterial dispersion liquid, filled in an interior of an electrostatic spray nozzle, and the observation substrateto electrostatically spray and dry the dispersion liquidand electrostatically deposit the nanomaterial. With respect to the observation substrate, including a conductive grid portionand a supporting film, a reference electrodeis disposed below the substrateand a bias voltage of the same polarity as the electrostatic spraying voltage is applied to the grid portionof the substrateto adjust immobilization positions of the nanomaterial on the substrate. An observation sample, with which the nanomaterial is immobilized in a satisfactory state on the substrate, can thereby be prepared.


Find Patent Forward Citations

Kawakami, Tomonori. (2012). Nanomaterial observation sample preparation apparatus and preparation method (U.S. Patent No. 8276539). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8276539

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