The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2012

Filed:

Jan. 18, 2011
Applicants:

Brian John Mcnamee, Brockport, NY (US);

David B. Montfort, Webster, NY (US);

Jerry F. Adams, Waterport, NY (US);

Inventors:

Brian John McNamee, Brockport, NY (US);

David B. Montfort, Webster, NY (US);

Jerry F. Adams, Waterport, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to aspects of the embodiments, an apparatus and method is proposed to detect nip width by use of at least one piezoelectric (PZT) crystal embedded into a roll at both the inboard and outboard ends. A piezoelectric (PZT) crystal generates a charge when subjected to a load and when the load is released. The PZT generate signal is channeled to the ends of the roller such as with a brush contact to be processed and used within machine control. The duration measure from application and released of the load is indicative of the dwell time and the amplitude PZT generate signal is a function of the pressure. The time and amplitude of the PZT signal can be calibrated to correlate directly to nip width or pressure and tracked in machine control.


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