The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2012
Filed:
Jun. 08, 2010
Xiao-ming Tao, Hong Kong, HK;
Wei Zheng, Hong Kong, HK;
Xiao-hong Sun, Hong Kong, HK;
Guang-feng Wang, Hong Kong, HK;
Chi-yuen Hui, Hong Kong, HK;
Xiao-Ming Tao, Hong Kong, HK;
Wei Zheng, Hong Kong, HK;
Xiao-Hong Sun, Hong Kong, HK;
Guang-Feng Wang, Hong Kong, HK;
Chi-Yuen Hui, Hong Kong, HK;
Hong Kong Research Institute of Textiles and Apparel, Kowloon, HK;
Abstract
A measurement system () for detecting repeated large deformation comprising: a fiber optical strain sensor () including a flexible polymer optical fiber (POF) () in the form of a series of extended loops (), the loops () being flexible to allow rotation in the plane; and notches () formed on at least one side of the fiber (); a light source () connected to the POF (); and a photo-detector () to detect a change of the light power transmission loss through the notches () caused by the alteration of the shape of the notches () when the strain sensor () is strained.