The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Jan. 09, 2009
Applicants:

Tao Deng, Sunnyvale, CA (US);

Sachin Vasudeva, Fremont, CA (US);

Inventors:

Tao Deng, Sunnyvale, CA (US);

Sachin Vasudeva, Fremont, CA (US);

Assignee:

Juniper Networks, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In general, techniques are described for intelligently selecting test cases within testing environments. Specifically, a computing device may include a user interface with which a user interacts to specify a safety level. The device also includes a control unit that determines those functions of source code that changed. Based on these changed functions, the control unit determines those functions of the source code not changed but impacted by the changes within a set distance. The control unit then selects, for each of these determined functions, one or more test cases in accordance with one or more test selection algorithms by adaptively applying these algorithms in order of decreasing safety assurances and increasing precision. The control unit further aggregates these selected test cases and implement the test cases to ensure the safety level with respect to a percentage of functional errors occurring within a software program compiled from the source code.


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