The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Dec. 18, 2009
Christopher William Dern, Kirkland, WA (US);
Roy Patrick Tan, Redmond, WA (US);
Shaun Emory Miller, Issaquah, WA (US);
Christopher William Dern, Kirkland, WA (US);
Roy Patrick Tan, Redmond, WA (US);
Shaun Emory Miller, Issaquah, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
One embodiment described herein is directed to a method practiced in a computing environment. The method includes acts for determining test suite effectiveness for testing for concurrency problems and/or product faults. The method includes identifying a plurality of synchronization primitives in a section of implementation source code. One or more of the synchronization primitives are iteratively modified and a same test suite is run for each iteration. For each iteration, a determination is made whether or not the test suite returns an error as a result of modifying one or more synchronization primitives. When the test suite does not return an error, the method includes providing to a user an indication which indicates at least one of a test adequacy hole for the test suite; an implementation source code fault; or an equivalent mutant of the implementation source code.