The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

May. 15, 2008
Applicants:

Paul R. Day, Rochester, MN (US);

Randy L. Egan, Rochester, MN (US);

Roger A. Mittelstadt, Byron, MN (US);

Inventors:

Paul R. Day, Rochester, MN (US);

Randy L. Egan, Rochester, MN (US);

Roger A. Mittelstadt, Byron, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and program product that determine a density of a key value referenced in a database query over at least one range of rows, and utilize the determined density to optimize the database query. By doing so, the density of various key values may be determined and compared, and a bit map may be generated over the range of rows of the key value that is denser, resulting in a reduction of resources to build and use the bit map. Moreover, from the bit map over the range of rows to be selected after using the determined density, dense regions may be identified that can be used to optimize block I/O's according to the number of rows to be selected based on the query.


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