The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

May. 27, 2009
Applicants:

Kenny C. Gross, San Diego, CA (US);

Ramakrishna C. Dhanekula, San Diego, CA (US);

David K. Mcelfresh, San Diego, CA (US);

Inventors:

Kenny C. Gross, San Diego, CA (US);

Ramakrishna C. Dhanekula, San Diego, CA (US);

David K. McElfresh, San Diego, CA (US);

Assignee:

Oracle America, Inc., Redwood Shores, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.


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