The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Mar. 13, 2008
Applicants:

Ryohei Fujimaki, Tokyo, JP;

Hidenori Tsukahara, Tokyo, JP;

Akinori Satou, Tokyo, JP;

Inventors:

Ryohei Fujimaki, Tokyo, JP;

Hidenori Tsukahara, Tokyo, JP;

Akinori Satou, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a diagnostic system that diagnoses a diagnostic object by applying a diagnostic rule to data measured on the diagnostic object wherein an object of the present invention is to allow the diagnostic rule to be updated based on a variety of diagnostic case data. Each of multiple diagnostic devicesmakes a diagnosis by applying a diagnostic rule to diagnostic object data measured on a diagnostic objectand sends diagnostic case data, which includes diagnostic object data and its diagnostic result, to a diagnostic rule generation devicevia a network. The diagnostic rule generation devicegenerates a diagnostic rule based on the diagnostic case data received from the multiple diagnostic devicesand sends the generated diagnostic rule to the diagnostic devicesvia the network. The diagnostic devicesupdate a diagnostic rule in their devices with the diagnostic rule received from the diagnostic rule generation device


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