The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Jan. 19, 2007
Applicants:

Hoi Yeung Chan, New Canaan, CT (US);

Trieu Can Chieu, Scarsdale, NY (US);

Lawrence Shungwei Mok, Brewster, NY (US);

Inventors:

Hoi Yeung Chan, New Canaan, CT (US);

Trieu Can Chieu, Scarsdale, NY (US);

Lawrence Shungwei Mok, Brewster, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

A method and system of predicting a maintenance schedule and estimating a cost for warranty service of systems, for example, hardware systems, is provided. The method and system in one aspect may collect component usage data and obtain component reliability data for each of the plurality of components. A component life distribution module (CLDM) may be constructed based on the real time component usage data and the component reliability data, and from CLDM a mean time to fail data may be obtained. A system life distribution model (SLDM) may be selected and the mean time to fail data input into the SLDM to obtain an operating environment index that represents the effect of environment conditions on the lifetime and reliability. A maintenance schedule may be predicted and an adjusted cost of warranty service may be calculated based on the operating environment index for each of the plurality of components.


Find Patent Forward Citations

Loading…