The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Jan. 15, 2009
Applicants:

Kevin Michael Corry, Pflugerville, TX (US);

Mark Alan Peloquin, Austin, TX (US);

Steven Pratt, Leander, TX (US);

Karl Milton Rister, Austin, TX (US);

Andrew Matthew Theurer, Austin, TX (US);

Inventors:

Kevin Michael Corry, Pflugerville, TX (US);

Mark Alan Peloquin, Austin, TX (US);

Steven Pratt, Leander, TX (US);

Karl Milton Rister, Austin, TX (US);

Andrew Matthew Theurer, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Statistical profile data is refined by interrupting an execution of a software program in response to detecting a profiling event during the execution of the software program. An event sample associated with the profiling event is recorded in a log file. A set of markers describing and associated with the event sample is inserted into the log file.


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