The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Mar. 20, 2009
Amanda E. Mikhail, Rochester, MN (US);
Mark D. Plucinski, Rochester, MN (US);
Amanda E. Mikhail, Rochester, MN (US);
Mark D. Plucinski, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of statistical analysis is based on an accelerated degradation model for estimating the failure rate from a set of accelerated life data (e.g. stress, humidity, temperature, voltage, resistance, vibration, etc.). The method re-samples randomly distributed data and organizes it into subsets that may be ordered. The maximum is found for each subset. From the maximums a parametric LEV distribution is determined. Maximum Likelihood Estimation methods may be used to find the parameters employed in the determined LEV distribution. The failure rate is calculated using the determined LEV distribution of the sample maximums.