The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Jun. 23, 2009
Chung Lung Chang, Hsinchu, TW;
Chung Lung Chang, Hsinchu, TW;
Abstract
A semiconductor test system with self-inspection of an electrical channel is disclosed, which includes a tester head, a plurality of parameter detection units and a self-inspection controller. The tester head includes a plurality of pin electronics cards inserted therein, in which the plurality of pin electronics cards contain a plurality of power channels, a plurality of I/O channels and a plurality of drive channels. The self-inspection controller outputs different inspection signals respectively to each power channel, each I/O channel and each drive channel. Then, the plurality of parameter detection units detect response signals respectively produced by each power channel, each I/O channel and each drive channel in response to the inspection signals respectively received thereby, and the response signals are judged by the self-inspection controller. Thus, the invention is capable of self-inspecting each electrical channel if it is in a normal condition, either in an open or short circuit, or if there exists a leakage condition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile