The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Oct. 05, 2007
Kee Hoon Kim, Seoul, KR;
Yoon Seok OH, Gunpo, KR;
Kee hoon Kim, Seoul, KR;
Yoon seok Oh, Gunpo, KR;
Seoul National University Industry Foundation, Seoul, KR;
Abstract
Disclosed herein is a method and system for measuring magnetoelectric susceptibility. The system includes a magnet supplying a DC magnetic bias to a magnetoelectric sample, an AC drive coil applying an AC magnetic field to the magnetoelectric sample, a charge amplifier amplifying an electric charge signal of the magnetoelectric sample oscillating by the AC magnetic field, and a phase sensitive detector detecting the voltage signal produced by the charge amplifier while supplying induction current to the AC drive coil. Accordingly, it is possible to provide a highly sensitive system for measuring magnetoelectric susceptibility, which is essential for research on multiferroic and magnetoelectric bulk and thin film materials at room temperature, and can also operate in the physical property measurement system (PPMS, manufactured by Quantum Design Co., Ltd.) for measurements under low temperature and high magnetic field environments.