The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Jun. 09, 2006
Applicants:
Radu Bilcu, Tampere, FI;
Markku Vehviläinen, Tampere, FI;
Inventors:
Radu Bilcu, Tampere, FI;
Markku Vehviläinen, Tampere, FI;
Assignee:
Nokia Siemens Netowrks Oy, Espoo, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/40 (2006.01); G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a method, a device, an image quality evaluation module and a computer program product for determining the quality of an image. In an input image, at least one color component is iteratively restored with a deblur parameter, which deblur parameter is increased at each iteration. The iteration is stopped when an overshooting in the final image exceeds a predetermined value. After the iteration has been stopped, a number of iterations is defined and the quality of the image is determined according to the number of iterations.