The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Oct. 30, 2009
Andrew D. Wilby, Redondo Beach, CA (US);
J. Kent Harbaugh, Burbank, CA (US);
Andrew D. Wilby, Redondo Beach, CA (US);
J. Kent Harbaugh, Burbank, CA (US);
Raytheon Applied Signal Technology, Inc., Sunnyvale, CA (US);
Abstract
Classification of a potential target is accomplished by receiving image information, detecting a potential target within the image information and determining a plurality of features forming a feature set associated with the potential target. The location of the potential target is compared with a detection database to determine if it is close to an element in the detection database. If not, a single-pass classifier receives a potential target's feature set, classifies the potential target, and transmits the location, feature set and classification to the detection database. If it is close, a fused multi-pass feature determiner determines fused multi-pass features of the potential target and a multi-pass classifier receives the potential target's feature set and fused multi-pass features, classifies the potential target, and transmits its location, feature set, fused multi-pass features and classification to the detection database.