The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Feb. 27, 2009
Christopher J. Abel, Coplay, PA (US);
Parag Parikh, Allentown, PA (US);
Vladimir Sindalovsky, Perkasie, PA (US);
Christopher J. Abel, Coplay, PA (US);
Parag Parikh, Allentown, PA (US);
Vladimir Sindalovsky, Perkasie, PA (US);
LSI Corporation, Milpitas, CA (US);
Abstract
Methods and apparatus are provided for pseudo asynchronous testing of receive paths in serializer/deserializer (SerDes) devices. A SerDes device is tested by applying a source of serial data to a receive path of the SerDes device during a test mode. The receive path substantially aligns to incoming data using a bit clock. A phase is adjusted during the test mode of the bit clock relative to the source of serial data to evaluate the SerDes device. The source of serial data may be, for example, a reference clock used by a phase locked loop to generate the bit clock. The phase of the bit clock can be directly controlled during the test mode, for example, by a test phase control signal, such as a plurality of interpolation codes that are applied to an interpolator that alters a phase of the bit clock.