The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

May. 15, 2012
Applicants:

Yiduo Zhang, Cupertino, CA (US);

Tzong-shii Pan, San Jose, CA (US);

Yih-jen D. Chen, Fremont, CA (US);

William D. Huber, Hollister, CA (US);

Inventors:

Yiduo Zhang, Cupertino, CA (US);

Tzong-Shii Pan, San Jose, CA (US);

Yih-Jen D. Chen, Fremont, CA (US);

William D. Huber, Hollister, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/48 (2006.01); G11B 21/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein are embodiments directed to a head gimbal assembly including a novel suspension assembly that includes a flexure tail with a first plurality of apertures in its structural layer. Each of the first plurality of apertures underlies a first trace but not a second trace. Each of a second plurality of apertures in the structural layer underlies a second trace but not the first trace. Each of the first plurality of apertures includes a corresponding region of maximum width, and each of the second plurality of apertures includes a corresponding region of maximum width, as measured in the width direction. None of the corresponding regions of maximum width of the first plurality of apertures is disposed in an overlapping position along the long axis as any of the corresponding regions of maximum width of the second plurality of apertures.


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