The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2012
Filed:
Oct. 02, 2007
Udo Grittke, Steinen, DE;
Axel Humpert, Rheinau, DE;
Dietmar Frühauf, Lörrach, DE;
Harald Schäuble, Lörrach, DE;
Udo Grittke, Steinen, DE;
Axel Humpert, Rheinau, DE;
Dietmar Frühauf, Lörrach, DE;
Harald Schäuble, Lörrach, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.