The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8274278 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 25, 2012

Filed:

Dec. 10, 2009
Applicants:

Jeremy Walker, Delray Beach, FL (US);

Stephen E Saddow, Tampa, FL (US);

Inventors:

Jeremy Walker, Delray Beach, FL (US);

Stephen E Saddow, Tampa, FL (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automated, non-destructive anhysteretic magnetization characterization method for studying and modeling soft magnetic materials. This measurement method employs a 'reading-waveform' that allows multiple points of reference to be established in tracing out the B waveform. In using the reference values from this waveform, the components of B that cannot be measured directly may be calculated with precision. In turn, the initial magnitude of the B waveform is identified as the unknown component of the anhysteretic state. The processes can be repeated for different values of static fields as well as a function of temperature to produce a family of anhysteretic magnetization curves. The core characterization was performed without physically altering the core, so that the true anhysteretic magnetization curve, and the true B-H loop under applied bias H, is measured.


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