The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Aug. 09, 2007
Applicants:

Eric J. Markel, Kingwood, TX (US);

Robert O. Hagerty, La Porte, TX (US);

Richard B. Pannell, Kingwood, TX (US);

Inventors:

Eric J. Markel, Kingwood, TX (US);

Robert O. Hagerty, La Porte, TX (US);

Richard B. Pannell, Kingwood, TX (US);

Assignee:

Univation Technologies, LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 2/00 (2006.01); C08F 10/14 (2006.01); C08F 110/14 (2006.01); C08F 210/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

In some embodiments, a method including the steps of monitoring a polymerization reaction which produces a polymer resin in a fluid bed reactor, where a dry melt reference temperature is characteristic of melting behavior of a dry version of the resin, and in response to data indicative of at least one monitored parameter of the reaction, determining in on-line fashion a reduced melt reference temperature that is at least substantially equal to the difference between the dry melt reference temperature and a temperature by which the dry melt reference temperature is depressed by the presence of condensable diluent gas with the resin in the reactor. Optionally, the method also includes the step of controlling the reaction in response to the reduced melt reference temperature or a stickiness parameter determined from the reduced melt reference temperature.


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