The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2012

Filed:

Jun. 25, 2010
Applicants:

Nozomu Tamoto, Numazu, JP;

Mitsuaki Hirose, Shizuoka-ken, JP;

Akio Kosuge, Yokohama, JP;

Makoto Yasuda, Hiratsuka, JP;

Inventors:

Nozomu Tamoto, Numazu, JP;

Mitsuaki Hirose, Shizuoka-ken, JP;

Akio Kosuge, Yokohama, JP;

Makoto Yasuda, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming apparatus including an image bearing member having an electroconductive substrate on which are provided at least a photosensitive layer and a protection layer, in that sequence, a charging device that charges the surface of the image bearing member to form a latent electrostatic image thereon, a development device that develops the latent electrostatic image with a development agent containing toner to obtain a developed toner image, a cleaning device that removes toner remaining on the surface of the image bearing member and a lubricant material applicator that applies a lubricant material to the surface of the image bearing member, the protection layer containing a cured resin and a filler and the surface form of the protection layer having an arithmetical mean waviness Wa of from 0.05 to 0.3 μm and an average length WSm of profile elements of from 0.5 to 1.5 mm, which are obtained from a waviness profile obtained by filtering a coarse component with a λc profile filter of 0.25 mm and filtering a wavelength component longer than a waviness with a λf profile filter of 2.5 mm.


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