The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Dec. 01, 2010
Kazuhiko Iwasaki, Tokyo, JP;
Masayuki Arai, Tokyo, JP;
Kenichi Ichino, Tokyo, JP;
Silicon Test Technologies. Inc., Tokyo, JP;
Abstract
A program executed on a computer including storage, processing, output, and input units, the storage unit storing test-difficulty-calculation-elements-database, test-menu-database, and test-flow-database, for each test-menu-record, the program causing the processing unit to execute: calculating test-difficulty for each test-menu-record based on test-difficulty-calculation-formula by using at least one among pieces of information indicative of relationship with netlist, the number of package/test pins, expected operational clock frequency, process technology information, power consumption, and tester storage space; identifying all relationship between DFT scheme and priority, and causing the storage unit to store information indicative of the relationship between the DFT scheme and priority into the test-flow-database; and sorting the DFT scheme in an order of the priority based on the relationship between the DFT scheme and priority, causing the storage unit to store the DFT scheme as a test flow, and causing the output unit to output the test flow.