The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8271225 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 18, 2012

Filed:

Apr. 26, 2010
Applicants:

Yung-cheng Hung, Taipei Hsien, TW;

Wang-ding Su, Taipei Hsien, TW;

Jui-hsiung Ho, Taipei Hsien, TW;

Inventors:

Yung-Cheng Hung, Taipei Hsien, TW;

Wang-Ding Su, Taipei Hsien, TW;

Jui-Hsiung Ho, Taipei Hsien, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 29/00 (2006.01); G06F 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test system includes a main selector, a first and a second switching connectors, a first and a second sub-selectors, and a processor. The main selector includes a number of first switches, a number of first contacts, and a number of second contacts. Each sub-selector includes a second switch, a third contact, and a fourth contact. The processor sends a first instruction and a second instruction to correspondingly control the main selector and a selected sub-selector.


Find Patent Forward Citations

Hung, Yung-Cheng. (2012). Test system for connectors with multi-input (U.S. Patent No. 8271225). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8271225

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