The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Apr. 29, 2009
Valin Reja, Queens Park, AU;
Alister Kwok, Sefton, AU;
Glenn Stone, Glenwood, AU;
Corbett Research Pty Ltd, Wales, AU;
Abstract
A computer-implemented method of analysis of melt curve data comprising the steps of: (a) parameter model fitting the melt curve data; (b) performing a principal component analysis of the melt curve data; and (c) utilizing the principal components for clustering the melt curve data into groups. Such a method allows an efficient analysis of variations in melt curve shape and position and allows to statistically quantify these variations for both supervised and unsupervised data sets. Current melt analysis methods neither allow for statistical measures of each unknown nor do they allow for the determination of unsupervised data sets (i.e., unknown number of groups present). Particularly, the method according to the invention can be advantageous for identifying a specific sequence of dsDNA in a sample after performing a polymerase chain reaction (PCR).