The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2012

Filed:

Jan. 06, 2005
Applicants:

Pauli Misikangas, Helsinki, FI;

Lare Lekman, Helsinki, FI;

Inventors:

Pauli Misikangas, Helsinki, FI;

Lare Lekman, Helsinki, FI;

Assignee:

Ekahau, Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for using at least one signal quality parameter in an application. A target device makes observations of at least one signal quality parameter in a wireless communication environment. Because there are gross differences between different target devices' observations, there are one or more device models that compensate for the differences. A selection logic selects an optimal device model for each target device. The observations made by the target device are processed with the selected device model and applied to an application, such as a positioning application or network planning.


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