The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Aug. 24, 2009
Kanou Saitou, Saitama, JP;
Mitsunori Shioi, Saitama, JP;
Hajime Misumi, Saitama, JP;
Fujio Osawa, Saitama, JP;
Susumu Takagaki, Saitama, JP;
Yuji Sato, Saitama, JP;
Tadakazu Tsutehira, Saitama, JP;
Hideo Kageyama, Saitama, JP;
Takashi Kubo, Saitama, JP;
Kanou Saitou, Saitama, JP;
Mitsunori Shioi, Saitama, JP;
Hajime Misumi, Saitama, JP;
Fujio Osawa, Saitama, JP;
Susumu Takagaki, Saitama, JP;
Yuji Sato, Saitama, JP;
Tadakazu Tsutehira, Saitama, JP;
Hideo Kageyama, Saitama, JP;
Takashi Kubo, Saitama, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
A prediction table is stored in an NVM and an in-apparatus temperature is measured by a temperature sensor, a registration control adjustment based on the prediction table is carried out if an absolute value of a variation in the in-apparatus temperature is smaller than a threshold, and a registration adjusting patch is formed to actually measure a positional shift amount if the absolute value of the variation in the in-apparatus temperature is equal to or greater than the threshold. When the positional shift amount measured actually is greatly different from a value of the prediction table, the value of the prediction table is modified into the actually measured value.