The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Sep. 18, 2008
Symon D. Cotton, Great Gransden, GB;
Robert J. Morse, Cambridge, GB;
Mark Chellingworth, Vale of Glamorgan, GB;
Symon D. Cotton, Great Gransden, GB;
Robert J. Morse, Cambridge, GB;
Mark Chellingworth, Vale of Glamorgan, GB;
Medx Health Corporation, Mississauga, Ontario, CA;
Abstract
A method of obtaining a measurement of the extent of telangectasia in an area of skin is disclosed. Initially (S-) an image of an area of skin () to be analyzed is obtained. The obtained image is then processed (S--S-) to determine blood distribution data indicative of the distribution of blood in an imaged area of skin. This blood distribution data is then converted (S-) using a Discrete Fourier Transform and the converted blood distribution data is then processed to obtain a measurement of the extent features in a determined distribution of blood correspond to structures of a predetermined size. The obtained measurement of the extent of telangectasia can then be combined (s-) with other measurements of the effects of photo-damage such as measurements of melanin disorder and collagen degradation to obtain a measurement of the extent of photo-damage.