The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Dec. 21, 2009
Paavana Sainath, Oconomowoc, WI (US);
Peter Crandall, Oconomowoc, WI (US);
Abdelaziz Ikhlef, Waukesha, WI (US);
Chad Smith, Franklin, WI (US);
Ron Kent Hockersmith, Waukesha, WI (US);
Baojun LI, Sharon, MA (US);
Paavana Sainath, Oconomowoc, WI (US);
Peter Crandall, Oconomowoc, WI (US);
Abdelaziz Ikhlef, Waukesha, WI (US);
Chad Smith, Franklin, WI (US);
Ron Kent Hockersmith, Waukesha, WI (US);
Baojun Li, Sharon, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
An imaging system includes a rotatable gantry having an opening therein to receive a subject to be scanned and configured to rotate about a central axis in a rotation direction. The imaging system also includes a first x-ray source coupled to the rotatable gantry at a first position, wherein the first position is offset from the central axis of the rotatable gantry by a first distance. Further, the imaging system includes a second x-ray source coupled to the rotatable gantry at a second position, wherein the second position is offset from the central axis of the rotatable gantry by a second distance, wherein the second position is offset from the first position in a direction coincident with the rotation direction, and wherein the second position is offset from the first position in a direction parallel to the central axis.