The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Oct. 15, 2009
Applicant:
Keishi Ueno, Iruma, JP;
Inventor:
Keishi Ueno, Iruma, JP;
Assignee:
TEAC Corporation, Tama-shi, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided an optical disk device which quickly inspects the presence or absence of a defect in an optical disk in order to ensure that it can be played back on various types of optical disk devices. A detection unit uses signals supplied from a playback unit to detect defects from each of an RF signal, a focus error signal, and a tracking error signal. A CPU stores positions of the defects in a memory. The playback unit plays back data while degrading playback conditions at the positions of the defects . The detection unit detects an error rate of the played-back data, and finally determines whether the optical disk is 'OK' or 'NG'.