The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2012

Filed:

Nov. 18, 2010
Applicants:

Robert Floyd Payne, Lucas, TX (US);

Philip M. Pratt, McKinney, TX (US);

William David Smith, Allen, TX (US);

Inventors:

Robert Floyd Payne, Lucas, TX (US);

Philip M. Pratt, McKinney, TX (US);

William David Smith, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 27/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods disclosed herein operate to compensate for skew between inverse phases (e.g., differential phases) of an analog signal appearing at the inputs of an analog signal capture circuit such as a track-and-hold or sample-and-hold circuit associated with an ADC or similar device. Each of two capture clocks is used to capture one of the inverse phases. One or more delay circuits are configured to create a differential delay between clock transitions associated with the two capture clocks. The differential delay is proportional to the input skew between the inverse phases. The phases are consequently sampled at substantially identical points on a phase domain axis. Embodiments operate to create phase sampling synchronicity and to thereby decrease the amplitude of a common-mode signal component that results from the skew. Increased linearity and decreased distortion may result.


Find Patent Forward Citations

Loading…