The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2012

Filed:

Dec. 21, 2009
Applicants:

Cheng-yung Teng, Xindian, TW;

Shao-tien Kan, Taipei, TW;

Yu-sheng Chen, Xindian, TW;

Inventors:

Cheng-Yung Teng, Xindian, TW;

Shao-Tien Kan, Taipei, TW;

Yu-Sheng Chen, Xindian, TW;

Assignee:

Princeton Technology Corporation, Sindian, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a handler and a method for testing the same. The handler comprises a sorter and a testing module. The testing module further comprises a signal generator, a sensor, and a signal comparator. The signal generator generates and sends out a first handling signal. The sorter receives the first handling signal and correspondingly places a first electronic component on a first region according to the first handling signal. The sensor senses the first electronic component on the first region, and then correspondingly generates and sends out a second handling signal. The signal comparator is electrically connected to the sensor and the signal generator, and receives the first handling signal and the second handling signal. The signal comparator determines whether the first handling signal is equivalent to the second handling signal, and correspondingly sends out a comparing signal.


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