The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2012

Filed:

Sep. 17, 2009
Applicants:

Timothy Hunkapiller, Mercer Island, WA (US);

Cheryl Heiner, La Honda, CA (US);

Curtis Gehman, San Carlos, CA (US);

James Labrenz, San Francisco, CA (US);

Shiaw-min Chen, San Jose, CA (US);

Inventors:

Timothy Hunkapiller, Mercer Island, WA (US);

Cheryl Heiner, La Honda, CA (US);

Curtis Gehman, San Carlos, CA (US);

James Labrenz, San Francisco, CA (US);

Shiaw-Min Chen, San Jose, CA (US);

Assignee:

Applied Biosystems, LLC, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present teachings relate, among other things, to polynucleotide sequencing, fragment analysis and sample/lane tracking, and to polynucleotide sequencers and analyzers that employ optical detection techniques. Embodiments of the present teachings are described which include, for example, the addition of a calibration standard to a sequencing reaction. Information such as peak spacing and peak shape can be extracted from the standard.


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