The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
May. 17, 2003
Ralf Steuerwald, Welzheim, DE;
Dirk Steinmueller, Karlsruhe, DE;
Camiel Heffels, Ditzingen, DE;
Abstract
An on-line analyzer for analyzing a test sample, having a measuring device, which includes at least one measuring cell and at least one optoelectronic component. The measuring device determines, at at least one wavelength, the transmission or absorption of electromagnetic radiation passing through the test sample and provides measurement signals. The analyzer further includes a control/evaluation unit, which evaluates the measurement signals delivered by the measuring device and makes analysis data available. The measuring cell and the control/evaluation unit are located spatially separated from one another; the at least one optoelectronic component of the measuring device is assigned to the control/evaluation unit; the measuring cell and the at least one optoelectronic component are connected together via a light wave conductor.