The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Jun. 05, 2009
Kee Hae Kwon, Gunpo-si, KR;
IL Jin Kim, Gunpo-si, KR;
Hyung Rang Moon, Seoul, KR;
Jae Bum Park, Incheon, KR;
Seong Ho Kong, Seoul, KR;
O Sung Kwon, Gunpo-si, KR;
Kee Hae Kwon, Gunpo-si, KR;
Il Jin Kim, Gunpo-si, KR;
Hyung Rang Moon, Seoul, KR;
Jae Bum Park, Incheon, KR;
Seong Ho Kong, Seoul, KR;
O Sung Kwon, Gunpo-si, KR;
Cheil Industries Inc., Gumi-si, KR;
Abstract
Disclosed herein is a method for evaluating scratch resistance of a plastic resin comprising scratching a surface of a test sample of plastic resin using a scratch apparatus to form a scratch of the surface having a scratch profile; scanning the scratched test sample with a surface profile analysis apparatus to measure the scratch profile; and creating a scratch resistance evaluation index based on the measured scratch profile to evaluate the scratch resistance of the test sample. The method has good reliability and reproducibility, reduces measurement time and errors caused by measurers and measuring conditions, provides easy measurement and can be widely applied to all plastic resins.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile