The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Apr. 26, 2011
Applicants:

Hsiao-yun Su, Tu-Cheng, TW;

Ying-tso Lai, Tu-Cheng, TW;

Cheng-hsien Lee, Tu-Cheng, TW;

Inventors:

Hsiao-Yun Su, Tu-Cheng, TW;

Ying-Tso Lai, Tu-Cheng, TW;

Cheng-Hsien Lee, Tu-Cheng, TW;

Assignee:

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method of optimizing parameters of electronic components on printed circuit boards (PCBs), a first experiment table for m variables of one type of parameter of P electronic components on a PCB is designed using n values of each variable and the RSM. P EHs of each first experiment are obtained by simulating, and P EH empirical formulas are computed according to the P EHs. A second experiment table for the m variables is designed using n' values of each variable and the full factorial design, and P EHs of each second experiment are computed using the P EH empirical formulas. Experiments, all the P EHs of which are greater than 1, are filtered from the second experiment tables, and an average EH of each filtered experiment is computed to pick an experiment the average EH of which is the greatest. The values of the m variables in the picked experiment are considered as optimized.


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