The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Apr. 06, 2009
Applicants:

Wilson Chan, San Mateo, CA (US);

Cheng-lu Hsu, Sunnyvale, CA (US);

Angelo Pruscino, Los Altos, CA (US);

Inventors:

Wilson Chan, San Mateo, CA (US);

Cheng-Lu Hsu, Sunnyvale, CA (US);

Angelo Pruscino, Los Altos, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are techniques for dynamically monitoring process activeness of processes running on a computing node. Problems affecting processes to serve their designated functions on the computing node can be relatively quickly detected and dealt with, thereby making restoring process activeness on the computing node much more quickly than otherwise.


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Chan, Wilson. (2012). Process activeness check (U.S. Patent No. 8266479). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8266479

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