The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Dec. 09, 2010
Applicants:

Filip Radlinski, Vancouver, CA;

Nick Craswell, Seattle, WA (US);

Peter Bailey, Kirkland, WA (US);

Daniel Schwartz, Seattle, WA (US);

Aidan Crook, Bellevue, WA (US);

Likhita Krishnamurthy, Seattle, WA (US);

Inventors:

Filip Radlinski, Vancouver, CA;

Nick Craswell, Seattle, WA (US);

Peter Bailey, Kirkland, WA (US);

Daniel Schwartz, Seattle, WA (US);

Aidan Crook, Bellevue, WA (US);

Likhita Krishnamurthy, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and computer-readable media are provided for improving the efficiency of the interleaving process. Once it is determined that a search query is to be used in an interleaving experiment, a primary ranking system and a secondary ranking system are analyzed to determine whether their respective search results for that search query would be identical. If the search results would be identical, the search query is routed only to the primary ranking system and not the secondary ranking system. If, however, it is determined that the search results would not be identical, both the primary ranking system and the secondary ranking system receive the search query for processing.


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