The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Jan. 10, 2008
Christian A. Portal, Holliston, MA (US);
Michael J. Thomas, Framingham, MA (US);
Christian A. Portal, Holliston, MA (US);
Michael J. Thomas, Framingham, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A method for testing a system under test includes defining a test having a number of test elements where at least one of the test elements corresponds to a simulation model with a metric setting. A test vector is defined for the test, and it is used to determine a number of test iterations. The metric setting of the simulation model is mapped to a test variable, and when the test is run metric data is generated from the simulation model during each test iteration. The metric data generated for each test iteration is accumulated and displayed.