The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Aug. 20, 2009
Applicants:

Noel J. Brady, Dublin, IE;

Lionel Barker, Dublin, IE;

Peter H. Alfke, Los Altos Hills, CA (US);

Inventors:

Noel J. Brady, Dublin, IE;

Lionel Barker, Dublin, IE;

Peter H. Alfke, Los Altos Hills, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit measures a time interval between a first event and a second event. One or more activity inputs receive a respective signal indicating the first and second events. For each activity input, a respective high-speed serial receiver includes a sampling circuit and a deserializer. The sampling circuit generates sample bits from sampling the respective signal at active edges of a clock signal. The deserializer converts the sample bits into a sequence of parallel data words. The sample bits undergo a first change in response to the first event and a second change in response to the second event. An arithmetic circuit receives the sequence of parallel data words from the respective high-speed serial receiver. The arithmetic circuit determines a number of the sample bits between the first and second changes in the sequence of parallel data words. The number measures the time interval between the first and second events.


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