The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8265880 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 11, 2012

Filed:

Jul. 01, 2009
Applicants:

Takeshi Asakawa, Chiba, JP;

Naoya Sazuka, Tokyo, JP;

Tetsuya Shiraishi, Tokyo, JP;

Inventors:

Takeshi Asakawa, Chiba, JP;

Naoya Sazuka, Tokyo, JP;

Tetsuya Shiraishi, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G06F 15/00 (2006.01); G11C 17/00 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A gene expression level analyzing method includes the steps of: acquiring expression levels of a plurality of target genes in a target cell every measurement time; extracting a maximum expression level and a minimum expression level from the expression levels of the target genes every measurement time; calculating a correlation coefficient of a frequency distribution of the gene having the maximum expression level at each measurement time and a frequency distribution of the gene having the minimum expression level at each measurement time; and comparing the correlation coefficient with a threshold value of the correlation coefficient.


Find Patent Forward Citations

Asakawa, Takeshi. (2012). Gene expression level analyzing method, gene expression level anlayzing program, and gene expression level analyzing device (U.S. Patent No. 8265880). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8265880

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