The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Aug. 19, 2009
Applicants:
Yingwei Yu, Katy, TX (US);
Clifford Lee Kelley, Sugar Land, TX (US);
Irina M. Mardanova, Houston, TX (US);
Inventors:
Yingwei Yu, Katy, TX (US);
Clifford Lee Kelley, Sugar Land, TX (US);
Irina M. Mardanova, Houston, TX (US);
Assignee:
IHS Global Inc., Englewood, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method is disclosed for automatically extending interpreter horizon picks over a wider area of traces in such manner that the automatically generated picks are very similar to picks that an interpreter would pick manually. The method applies optical filters to seismic sections to determine the intrinsic orientation of seismic events. Seismic orientation is captured in the Orientation Vector Field, which is then used to guide the picking process.