The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Mar. 10, 2008
Applicants:

Hiroshi Fujita, Gifu, JP;

Toshiaki Nakagawa, Hamamatsu, JP;

Yoshinori Hayashi, Ogaki, JP;

Inventors:

Hiroshi Fujita, Gifu, JP;

Toshiaki Nakagawa, Hamamatsu, JP;

Yoshinori Hayashi, Ogaki, JP;

Assignee:

Kowa Company, Ltd., Nagoya-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/30 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an image analysis system which captures image data of an arbitrary pair of a first image RI and a second image LI among images obtained by color-photographing a single object from different positions into an analysis computer, wherein the computer includes corresponding point extraction means for assigning a weighing factor to a pixel information value based on the contrast size of the pixel information value in each of a first local area ROIset around an arbitrary reference point in RI and second local areas ROIs at which scanning is performed on LI, calculating the similarity between ROIand ROIs, and extracting a corresponding point which corresponds to the reference point from a ROIhaving the highest similarity, and depth information calculating means for calculating depth information of the object based on coordinates of the reference point and the corresponding point.


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