The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Apr. 12, 2007
Applicants:
Osamu Ohji, Hyogo, JP;
Toshihisa Doi, Moscow, RU;
Inventors:
Osamu Ohji, Hyogo, JP;
Toshihisa Doi, Moscow, RU;
Assignee:
Kawasaki Jukogyo Kabushiki Kaisha, Kobe-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A novel method for evaluating cell detachment which can be used in passage operation and the like in culture of adhesive cells; a method of detaching a cultured cell utilizing the same; an apparatus for evaluating cell detachment for carrying out the aforementioned method for evaluating cell detachment; and an automated cell culture apparatus in which the apparatus is used are provided.
Ohji, Osamu. (2012). Method for evaluating cell detachment, method of detaching cultured cell, apparatus for evaluating cell detachment and automated cell culture apparatus (U.S. Patent No. 8265371). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8265371
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile