The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Jul. 02, 2009
Applicant:
William H. Barrow, Clermont, FL (US);
Inventor:
William H. Barrow, Clermont, FL (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for optical damage assessment using an existing imaging focal plane array and a fixed or moving set of optics and filters. Advantages include cost reductions and improved reliability due to fewer components and therefore fewer points of failure.
Barrow, William. (2012). System and method for analysis of image data (U.S. Patent No. 8265338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8265338
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile